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About the Role
Key Responsibilities: Interface with ASIC design teams to ensure DFT design rules and coverages are met. Generate high-quality manufacturing ATPG test patterns for stuck-at (SAF), transition fault (TDF) models through the use of on-chip test compression techniques. MBIST verification (including repair), test pattern generation through Mentor tool. ATPG (SAF, TDF) and MBIST verification using unit delay and min/max timing corner simulations. Work with Product/Test engineering teams on the delivery of manufacturing test patterns for ATE. Responsible for supporting post-silicon debug effort, issue resolution. Responsible for Diagnostic Tool generation for ATPG, MBIST and bring-up on ATE. Developing, enhancing and maintaining scripts as necessary. Preferred Experience: Bachelor's degree in Computer Science, Electrical/Electronics Engineering 7 to 15 years' experience in ASIC/DFT - simulation and Silicon validation. Should have worked in at least one Full chip DFT Detailed knowledge on DFT ...
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