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About the Role
- Develop, debug, and bring up Scan ATPG test patterns on ATE platforms.
- Perform ATE test program development and validation during new product introduction (NPI).
- Debug scan test failures and analyze yield issues.
- Support pattern bring-up , correlation, and production release activities.
- Perform silicon characterization and electrical validation.
- Drive test time reduction and test optimization to improve manufacturing efficiency.
- Work closely with DFT, design, product, and validation teams to resolve test issues.
- Support failure analysis and root cause investigation for production problems.
- Bachelor’s Degree in Electrical / Electronics / Computer Engineering or related field.
- Experience in ATE testing and semiconductor production environment.
- Hands‑on experience with Scan / ATPG pattern debug or development ...
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